NvisANA

Gloabl Menu

  • Company Information
    • About Us
    • Greetings from CEO
    • History
    • Business Place Introduction
    • Growth strategy
    • How to find us
  • Product Introduction
    • Portfolio
    • M-SPEC
    • O-SPEC
    • I-SPEC
  • Research & Development
    • Research Center Introduction
    • Retention Technology
    • Patent Status
  • P.R
    • Notice
    • News
  • Talent Recruitment
    • Talent Aspects
    • Welfare Benefits
    • Job introduction
    • Recruitment procedure
    • Employees Story
ENG
  • KOR
  • Home

    • Portfolio
    • M-SPEC
    • O-SPEC
    • I-SPEC
    As the device node enters into 20nm era, the effect of non-visual defects, such as metallic and non-metallic contamination,
    on the device performance is getting more and more significant and cannot be neglected anymore.
    And the non-visual defect control will be crucial to yield management of under 20nm devices.
    Our M-SPEC, O-SPEC and I-SPEC provides you with total solution of metallic, organic and ionic contamination monitoring for gases,
    chemicals and wafers in the semiconductor ecosystem, respectively.
      • NvA-MC3000 Series
      • NvA-MG3000 Series
      • NvA-MW300 Series
      • NvA-OW300 Series
      • NvA-IW300 Series
Address
#2801, U-Tower, 120, Heungdeok Jungang-ro, Giheung-gu, Yongin-si, Gyeonggi-do, Korea
TEL
070-4202-0757
Sales
070-5143-3782
FAX
031-898-0757

Copyrights (c) 2019 NvisANA all Rights Reserved.

Total : 75382